Integrated Circuits

CD4011B NAND gates provide the system designer with direct implementation of the NAND function and supplement the existing family of CMOS gates. All inputs and outputs are buffered. Features:

• Propagation delay time = 60 ns (typ.) at CL = 50 pF, VDD = 10 V
• Buffered inputs and outputs
• Standardized symmetrical output characteristics
• Maximum input current of 1 µA at 18 V over-full package temperature range; 100 nA at 18 V and 25°C
• 100% tested for quiescent current at 20 V
• 5-V, 10-V, and 15-V parametric ratings
• Noise margin (over full package temperature range:
  
  • 1 V at VDD = 5 V
  • 2 V at VDD = 10 V
  • 2.5 at VDD = 15 V
• Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of "B" Series CMOS Devices"

CD4021B series types are 8-stage parallel- or serial-input/serial output registers having common CLOCK and PARALLEL/SERIAL CONTROL inputs, a single SERIAL data input, and individual parallel "JAM" inputs to each register stage. Each register stage is D-type, master-slave flip-flop. In addition to an output from stage 8, "Q" outputs are also available from stages 6 and 7. In the CD4021B serial entry is synchronous with the clock by parallel entry is asynchronous. Entry is controlled by the PARALLEL/SERIAL CONTROL input. When the PARALLEL/SERIAL CONTROL input is low, data is serially shifted into the 8-stage register synchronously with the positive transition of the clock line. When the PARALLEL/SERIAL CONTROL input is high, data is jammed into the 8-stage register via the parallel input lines and synchronous with the positive transition of the clock line.

CD4029B consists of a four-stage binary or BCD-decade up/down counter with provisions for look-ahead carry in both counting modes. The inputs consist of a single CLOCK, CARRY-IN\ (CLOCK ENABLE\), BINARY/DECADE, UP/DOWN, PRESET ENABLE, and four individual JAN signals, Q1, Q2, Q3, Q4 and a CARRY OUT\ signal are provided as outputs. A high PRESET ENABLE signal allows information on the JAM INPUTS to preset the counter to any state asynchronously with the clock. A low on each JAM line, when the PRESET-ENABLE signal is high, resets the counter to its zero count. The counter is advanced one count at the positive transition of the clock when the CARRY-IN\ and PRESET ENABLE signals are low. Advancement is inhibited when the CARRY-IN\ or PRESET ENABLE signals are high. The CARRY-OUT\ signal is normally high and goes low when the counter reaches its maximum count in the UP mode or the minimum count in the DOWN mode provided the CARRY-IN\ signal is low.

CD4030B types consist of four independent Exclusive-OR gates. THe CD4030B provides the system designer with a means for direct implementation of the Exclusive-OR function. Features:

• Medium-speed operation—tPHL, tPLH = 65 ns (typ.) at VDD = 10 V, CL = 50 pF
• 100% tested for quiescent current at 20 V
• Standardized, symmetrical output characteristics
• 5-V, 10-V, and 15-V parametric ratings
• Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
• Noise margin (over full package-temperature range) =
  
  • 1 V at VDD = 5 V
  • 2 V at VDD = 10 V
  • 2.5 V at VDD = 15 V
• Meets all requirements of JEDEC Tentative Standard No.

The CD4050B devices are noninverting hex buffers, and feature logic-level conversion using only one supply voltage (VCC). The input-signal high level (VIH) can exceed the VCC supply voltage when these devices are used for logic level conversions. These devices are intended for use as CMOS to DTL or TTL converters and can drive directly two DTL or TTL loads. (VCC = 5 V, VOL ≤ 0.4 V, and IOL ≥ 3.3 mA.) Features:

• Noninverting
• High Sink Current for Driving 2 TTL Loads
• High-to-Low Level Logic Conversion
• 100% Tested for Quiescent Current at 20 V
• Maximum Input Current of 1 µA at 18 V Over Full
• Package Temperature Range; 100 nA at 18 V and 25°C
• 5-V, 10-V, and 15-V Parametric Ratings

Applications

• CMOS to DTL or TTL Hex Converters
• CMOS Current Sink or Source Drivers
• CMOS High-to-Low Logic Level Converters

CD4081B AND gates, provide the system designer with direct implementation of the AND function and supplement the existing family of CMOS gates. Features:

• Medium-Speed Operation - tPLH, tPHL = 60 ns (typ.) at VDD = 10 V
• 100% tested for quiescent current at 20 V
• Maximum input current of 1 µA at 18 V over full package-temperature range: 100 nA at 18 V and 25°C
• Noise margin (full package-temperature range) =
  
  • 1 V at VDD = 5 V
  • 2 V at VDD = 10 V
  • 2.5 V at VDD = 15 V
• Standardized, symmetrical output characteristics
• 5-V, 10-V, and 15-V parametric ratings
• Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"